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Moribayashi, Kengo
Nuclear Instruments and Methods in Physics Research B, 314, p.30 - 33, 2013/11
Times Cited Count：4 Percentile：33.02(Instruments & Instrumentation)Kitamura, Akane; Sato, Takahiro; Koka, Masashi; Kamiya, Tomihiro; Kobayashi, Tomohiro*
Nuclear Instruments and Methods in Physics Research B, 314, p.82 - 85, 2013/11
Times Cited Count：7 Percentile：49.28(Instruments & Instrumentation)Kitamura, Akane; Yamaki, Tetsuya; Yuri, Yosuke; Sawada, Shinichi; Yuyama, Takahiro
Nuclear Instruments and Methods in Physics Research B, 314, p.47 - 50, 2013/11
Times Cited Count：1 Percentile：11.54(Instruments & Instrumentation)Sato, Shinichiro; Oshima, Takeshi
Nuclear Instruments and Methods in Physics Research B, 314, p.153 - 157, 2013/11
Times Cited Count：1 Percentile：11.54(Instruments & Instrumentation)Kato, Sho; Yamaki, Tetsuya; Yamamoto, Shunya; Hakoda, Teruyuki; Kawaguchi, Kazuhiro; Kobayashi, Tomohiro*; Suzuki, Akihiro*; Terai, Takayuki*
Nuclear Instruments and Methods in Physics Research B, 314, p.149 - 152, 2013/11
Times Cited Count：2 Percentile：19.73(Instruments & Instrumentation)We implanted 100 keV W
in unpolished GC substrates at nominal fluences up to 
ions/cm
. The implanted samples were electrochemically anodized in a NaOH aqueous solution to etch the surface layer. The analyses were performed by X-ray photoelectron spectroscopy (XPS), Rutherford backscattering spectrometry (RBS), and transmission electron microscopy (TEM). XPS W 4f spectra indicated the formation of carbides as reported previously. The electrochemical etching clearly increased the W concentration on the surface. According to the RBS results, half of the implanted W atoms were retained in the substrate, while the rest should escape to the etching solution. The cross-sectional TEM image revealed a uniform distribution of WC particles with a diameter of less than 10 nm just near the surface region.
Yamaki, Tetsuya; Nuryanthi, N.*; Koshikawa, Hiroshi; Asano, Masaharu; Sawada, Shinichi; Hakoda, Teruyuki; Maekawa, Yasunari; Voss, K.-O.*; Severin, D.*; Seidl, T.*; et al.
Nuclear Instruments and Methods in Physics Research B, 314, p.77 - 81, 2013/11
Times Cited Count：3 Percentile：26.71(Instruments & Instrumentation)Ion-track membranes of poly(vinylidene fluoride) (PVDF), a type of fluoropolymer, could find wide applications due to its superior chemical and mechanical properties. In order to produce track-etched pores in PVDF films, we have independently employed much milder etching conditions without any oxidant additives in the alkaline etching solution. The goal of this work is to pursue the possibility of varying beam parameters and applying the effect of the etching pretreatment to control the pore size and shape. Ongoing in-situ/on-line analyses at the M-branch of the UNILAC would shed light on the detailed chemistry of not only ion-induced degradation but also the post-irradiation reactivity.
Nuryanthi, N.*; Yamaki, Tetsuya; Koshikawa, Hiroshi; Asano, Masaharu; Sawada, Shinichi; Hasegawa, Shin; Maekawa, Yasunari; Katsumura, Yosuke*
Nuclear Instruments and Methods in Physics Research B, 314, p.95 - 98, 2013/11
Times Cited Count：3 Percentile：26.71(Instruments & Instrumentation)Our efforts have been focused on ion-track etched membranes of poly(vinylidene fluoride) (PVDF). This study deals with the effect of the transmembrane potential applied during the conductometry in order to offer a higher degree of freedom to control the pore size. We can say that higher voltage application during the conductometry would accelerate the etching in the tracks. The electrophoretic migration of dissolved products occurring out of each pore might be one of the reasons for this enhanced pore evolution and growth.
O
induced by swift heavy ion irradiationOkubo, Nariaki; Ishikawa, Norito; Sataka, Masao; Jitsukawa, Shiro
Nuclear Instruments and Methods in Physics Research B, 314, p.208 - 210, 2013/11
Times Cited Count：22 Percentile：83.85(Instruments & Instrumentation)Microstructure in single crystal AlO specimens developed during irradiation by 70-160 MeV-Xe ions has been examined with transmission electron microscope (TEM). Amorphization was observed around 800 nm depth through from ion-beam incident surface of the specimen. The amorphization was also evaluated with XRD technique. TEM observation also indicated that tracks were formed by irradiation at the deeper region than that of the amorphous layers. The number density and size of the tracks have been decreased with the depth from the ion-incident surface. It suggests that amorphization has been occurred by the overlapping of the tracks. It was also obvious that the thickness of the amorphous layers were smaller than those observed in poly-crystal alumina specimens. This may be interpreted by the difference of electronic energy loss in the specimen; lower energy loss for single crystal specimens for their crystallographic orientation against to the incident ion-beam.
Matsuda, Makoto; Asozu, Takuhiro; Sataka, Masao; Iwase, Akihiro*
Nuclear Instruments and Methods in Physics Research B, 314, p.43 - 46, 2013/11
Times Cited Count：0 Percentile：0.01(Instruments & Instrumentation)no abstracts in English
Hirata, Koichi*; Saito, Yuichi; Chiba, Atsuya; Yamada, Keisuke; Narumi, Kazumasa
Nuclear Instruments and Methods in Physics Research B, 314, p.39 - 42, 2013/11
Times Cited Count：4 Percentile：33.02(Instruments & Instrumentation)Aiko, Kazuma*; Toki, Atsushi*; Okuda, Shuichi*; Saito, Yuichi; Kamiya, Tomihiro; Nakamura, Tetsuya*; Kinoshita, Toyohiko*; Iwase, Akihiro*; Matsui, Toshiyuki*
Nuclear Instruments and Methods in Physics Research B, 314, p.99 - 102, 2013/11
Times Cited Count：5 Percentile：33.02(Instruments & Instrumentation)Saito, Yuichi; Chiba, Atsuya; Yamada, Keisuke; Narumi, Kazumasa
no journal, ,
Matoba, Shiro; Moriya, Sosuke*; Koizumi, Tetsuo*; Ishikawa, Manabu*; Takahashi, Karin*; Shiromaru, Haruo*
no journal, ,
Ishikawa, Norito; Sonoda, Takeshi*; Sawabe, Takashi*; Sataka, Masao
no journal, ,
UO is highly radiation-resistant material, and the origin of the radiation-resistance is analyzed in this study.
and C ionsNarumi, Kazumasa; Takahashi, Yasuyuki*; Chiba, Atsuya; Saito, Yuichi; Yamada, Keisuke; Ishikawa, Norito; Sugai, Hiroyuki*; Maeda, Yoshihito
no journal, ,
no abstracts in English
Iwamatsu, Kazuhiro; Taguchi, Mitsumasa; Sugo, Yumi; Kurashima, Satoshi; Yamashita, Shinichi; Katsumura, Yosuke
no journal, ,
no abstracts in English
Ota, Yushi*; Mamiya, Takuya*; Imai, Makoto*; Shibata, Hiromi*; Ito, Akio*; Sataka, Masao
no journal, ,
no abstracts in English
